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[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns
Voyiatzis, IoannisYear:
2014
Language:
english
DOI:
10.1109/ets.2014.6847836
File:
PDF, 169 KB
english, 2014