Surface Characterization of Polythiophene:Fullerene Blends on Different Electrodes Using Near Edge X-ray Absorption Fine Structure
Tillack, Andreas F., Noone, Kevin M., MacLeod, Bradley A., Nordlund, Dennis, Nagle, Kenneth P., Bradley, Joseph A., Hau, Steven K., Yip, Hin-Lap, Jen, Alex K.-Y., Seidler, Gerald T., Ginger, David S.Volume:
3
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/am101055r
Date:
March, 2011
File:
PDF, 2.31 MB
english, 2011