Thickness-Dependent Electronic Structure of Intermetallic...

Langmuir 2009 / 07 Vol. 25; Iss. 13

Thickness-Dependent Electronic Structure of Intermetallic CeCo 2 Nanothin Films Studied by X-ray Absorption Spectroscopy

Dong, Chung-Li, Chen, Chi-Liang, Asokan, Kandasami, Chang, Ching-Lin, Chen, Yang-Yuan, Lee, Jyh-Fu, Guo, Jinghua
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Volume:
25
Language:
english
Journal:
Langmuir
DOI:
10.1021/la803872w
Date:
July, 2009
File:
PDF, 1.00 MB
english, 2009
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