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Scanning Electron Microscopy for in Situ Monitoring of Semiconductor−Liquid Interfacial Processes: Electron Assisted Reduction of Ag Ions from Aqueous Solution on the Surface of TiO 2 Rutile Nanowire †
Kolmakova, Natalia, Kolmakov, AndreiVolume:
114
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp1044546
Date:
October, 2010
File:
PDF, 5.00 MB
english, 2010