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Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling
Kotis, L., Gurban, S., Pecz, B., Menyhard, M., Yakimova, R.Volume:
316
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2014.08.019
Date:
October, 2014
File:
PDF, 1.32 MB
english, 2014