[IEEE 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - Crystal City, VA, USA (2007.09.27-2007.09.29)] 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - Multispectral Local Binary Pattern Histogram for Component-based Color Face Verification
Chan, Chi-Ho, Kittler, Josef, Messer, KieronYear:
2007
Language:
english
DOI:
10.1109/btas.2007.4401951
File:
PDF, 6.41 MB
english, 2007