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[IEEE 2013 2nd International Conference on Measurement, Information and Control (ICMIC) - Harbin, China (2013.08.16-2013.08.18)] Proceedings of 2013 2nd International Conference on Measurement, Information and Control - Preparation and operation characteristics of nano-scale channel length vertical structure Zinc Oxide Thin Film Transistor
Yue Shan,, Dongxing Wang,, Yue Zhang,, Jiabin Chen,, Hao Zhang,, Jinghua Yin,, Hong Zhao,Year:
2013
Language:
english
DOI:
10.1109/mic.2013.6757945
File:
PDF, 493 KB
english, 2013