Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs
Moon, Joon-Bae, Moon, Dong-Il, Choi, Yang-KyuVolume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2014.2319245
Date:
June, 2014
File:
PDF, 1.07 MB
english, 2014