Inverse Class-F Design Using Dynamic Loadline GaN HEMT...

IEEE Microwave Magazine 2014 / 9 Vol. 15; Iss. 6

Inverse Class-F Design Using Dynamic Loadline GaN HEMT Models to Help Designers Optimize PA Efficiency [Application Notes]

Pengelly, Raymond S., Pribble, William, Smith, Thomas
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Volume:
15
Language:
english
Journal:
IEEE Microwave Magazine
DOI:
10.1109/mmm.2014.2333431
Date:
September, 2014
File:
PDF, 8.94 MB
english, 2014
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