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[ACM Press the 17th ACM SIGKDD international conference - San Diego, California, USA (2011.08.21-2011.08.24)] Proceedings of the 17th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '11 - A pattern discovery approach to retail fraud detection
Gabbur, Prasad, Pankanti, Sharath, Fan, Quanfu, Trinh, HoangYear:
2011
Language:
english
DOI:
10.1145/2020408.2020460
File:
PDF, 582 KB
english, 2011