Analysis of the Causes of Variance in Resistance...

Analysis of the Causes of Variance in Resistance Measurements on Metal−Molecule−Metal Junctions Formed by Conducting-Probe Atomic Force Microscopy

Engelkes, Vincent B., Beebe, Jeremy M., Frisbie, C. Daniel
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
109
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp052348s
Date:
September, 2005
File:
PDF, 1.03 MB
english, 2005
Conversion to is in progress
Conversion to is failed