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Analysis of the Causes of Variance in Resistance Measurements on Metal−Molecule−Metal Junctions Formed by Conducting-Probe Atomic Force Microscopy
Engelkes, Vincent B., Beebe, Jeremy M., Frisbie, C. DanielVolume:
109
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp052348s
Date:
September, 2005
File:
PDF, 1.03 MB
english, 2005