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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - A test set for LEDs life model estimation
Albertini, Andrea, Masi, Maria Gabriella, Mazzanti, Giovanni, Peretto, Lorenzo, Tinarelli, RobertoYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488033
File:
PDF, 927 KB
english, 2010