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[IEEE 2012 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Rome, Italy (2012.09.17-2012.09.21)] International Symposium on Electromagnetic Compatibility - EMC EUROPE - EMI comparison between Si and SiC technology in a boost converter
Bogonez-Franco, Paco, Sendra, Josep BalcellsYear:
2012
Language:
english
DOI:
10.1109/emceurope.2012.6396739
File:
PDF, 739 KB
english, 2012