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[IEEE 2012 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Rome, Italy (2012.09.17-2012.09.21)] International Symposium on Electromagnetic Compatibility - EMC EUROPE - EMI comparison between Si and SiC technology in a boost converter

Bogonez-Franco, Paco, Sendra, Josep Balcells
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Year:
2012
Language:
english
DOI:
10.1109/emceurope.2012.6396739
File:
PDF, 739 KB
english, 2012
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