[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - A 60ns 500 × 12 0.35 μ m CMOS Low-Power Scanning Read-Out IC for Cryogenic Infra-Red Sensors
Serra-Graells, F., Misischi, B., Casanueva, E., Mendez, C., Teres, L.Year:
2005
Language:
english
DOI:
10.1109/iscas.2005.1464944
File:
PDF, 557 KB
english, 2005