![](/img/cover-not-exists.png)
Radical surface interactions in industrial silicon plasma etch reactors
Cunge, G, Vempaire, D, Ramos, R, Touzeau, M, Joubert, O, Bodard, P, Sadeghi, NVolume:
19
Language:
english
Journal:
Plasma Sources Science and Technology
DOI:
10.1088/0963-0252/19/3/034017
Date:
June, 2010
File:
PDF, 1.41 MB
english, 2010