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AFM-Induced Amine Deprotection: Triggering Localized Bond Cleavage by Application of Tip/Substrate Voltage Bias for the Surface Self-Assembly of Nanosized Dendritic Objects
Fresco, Zachary M., Suez, Itai, Backer, Scott A., Fréchet, Jean M. J.Volume:
126
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja047774q
Date:
July, 2004
File:
PDF, 138 KB
english, 2004