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Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements
van Dalen, K. N., Drijkoningen, G. G., Smeulders, D. M. J., Heller, H. K. J., Glorieux, C., Sarens, B., Verstraeten, B.Volume:
130
Year:
2011
Language:
english
Journal:
The Journal of the Acoustical Society of America
DOI:
10.1121/1.3605537
File:
PDF, 2.12 MB
english, 2011