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Effect of thickness on the microstructure and soft magnetic properties of CoFeHfO thin films
Luu Van Tho, Kwang Eun Lee, Cheol Gi Kim, Chong Oh KimVolume:
8
Year:
2008
Language:
english
Pages:
3
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2007.04.027
File:
PDF, 311 KB
english, 2008