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Electrical properties of WSi2 nanocrystal memory with SiO2/Si3N4/SiO2 tunnel barriers
Ki Bong Seo, Dong Uk Lee, Seung Jong Han, Eun Kyu Kim, Hee-Wook You, Won-Ju ChoVolume:
10
Year:
2010
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2009.12.002
File:
PDF, 439 KB
english, 2010