![](/img/cover-not-exists.png)
Tunneling barrier engineered charge trap flash memory with ONO and NON tunneling dielectric layers
Goon-Ho Park, Myung-Ho Jung, Kwan-Su Kim, Hong-Bay Chung, Won-Ju ChoVolume:
10
Year:
2010
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2009.12.004
File:
PDF, 434 KB
english, 2010