Tunneling barrier engineered charge trap flash memory with...

Tunneling barrier engineered charge trap flash memory with ONO and NON tunneling dielectric layers

Goon-Ho Park, Myung-Ho Jung, Kwan-Su Kim, Hong-Bay Chung, Won-Ju Cho
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Volume:
10
Year:
2010
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2009.12.004
File:
PDF, 434 KB
english, 2010
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