High-Resolution Line Width Measurement of Single CdSe...

The Journal of Physical Chemistry C 2009 / 04 Vol. 113; Iss. 14

High-Resolution Line Width Measurement of Single CdSe Nanocrystals at Long Time Scales

Littleton, Bradley N., Fernée, Mark J., Gómez, Daniel E., Mulvaney, Paul, Rubinsztein-Dunlop, Halina
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Volume:
113
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp900887r
Date:
April, 2009
File:
PDF, 730 KB
english, 2009
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