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[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Combining fault tolerance and serialization effort to improve yield in 3D Networks-on-Chip
Kologeski, Anelise, Concatto, Caroline, Matos, Debora, Grehs, Daniel, Motta, Tiago, Almeida, Felipe, Kastensmidt, Fernanda Lima, Susin, Altamiro, Reis, RicardoYear:
2013
Language:
english
DOI:
10.1109/icecs.2013.6815370
File:
PDF, 535 KB
english, 2013