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A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping
Nakhostin, M, Veeramani, PVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/06/p06006
Date:
June, 2012
File:
PDF, 3.18 MB
english, 2012