Effect of multiplicative noise on least-squares parameter...

Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope

Sader, John E., Hughes, Barry D., Sanelli, Julian A., Bieske, Evan J.
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Volume:
83
Year:
2012
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4709496
File:
PDF, 829 KB
english, 2012
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