[IEEE 2010 33rd International Spring Seminar on Electronics Technology (ISSE) - Warsaw, Poland (2010.05.12-2010.05.16)] 33rd International Spring Seminar on Electronics Technology, ISSE 2010 - Dendrite material identification method using fractal analysis
Dominkovics, Cs., Harsanyi, G.Year:
2010
Language:
english
DOI:
10.1109/isse.2010.5547287
File:
PDF, 494 KB
english, 2010