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[IEEE Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference - Como, Italy (18-20 May 2004)] Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) - Cost-driven optimization of fault coverage in combined Built-In Self-Test/Automated Test Equipment testing
Shanrui Zhang,, Minsu Choi,, Park, N., Lombardi, F.Year:
2004
Language:
english
DOI:
10.1109/imtc.2004.1351486
File:
PDF, 391 KB
english, 2004