Enhanced TID Susceptibility in Sub-100 nm Bulk CMOS I/O...

IEEE Transactions on Nuclear Science 2007 / 12 Vol. 54; Iss. 6

Enhanced TID Susceptibility in Sub-100 nm Bulk CMOS I/O Transistors and Circuits

McLain, Michael, Barnaby, Hugh J., Holbert, Keith E., Schrimpf, Ronald D., Shah, Harshit, Amort, Anthony, Baze, Mark, Wert, Jerry
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2007.908461
Date:
December, 2007
File:
PDF, 932 KB
english, 2007
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