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[IEEE 2013 25th International Conference on Microelectronics (ICM) - Beirut, Lebanon (2013.12.15-2013.12.18)] 2013 25th International Conference on Microelectronics (ICM) - A method and an automated tool to perform SET fault-injection on HDL-based designs
Mansour, Wassim, Velazco, Raoul, Ayoubi, Rafic, Ziade, Haissam, El Falou, WassimYear:
2013
Language:
english
DOI:
10.1109/icm.2013.6734986
File:
PDF, 720 KB
english, 2013