Advanced Multiple-Angle Incidence Resolution Spectrometry...

Advanced Multiple-Angle Incidence Resolution Spectrometry for Thin-Layer Analysis on a Low-Refractive-Index Substrate

Hasegawa, Takeshi
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Volume:
79
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac070676d
Date:
June, 2007
File:
PDF, 228 KB
english, 2007
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