Temperature dependence of impact ionization coefficients in p-Si
Roze, K., Bannov, N. A., Kim, K. W., Holton, W. C., Littlejohn, M. A.Volume:
83
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.367303
File:
PDF, 236 KB
english, 1998