Examination of the cu/si(111) 5×5 structure by scanning...

Physical Review B 1988 / 12 Vol. 38; Iss. 17

Examination of the cu/si(111) 5×5 structure by scanning tunneling microscopy

Wilson, R. J., Chiang, S., Salvan, F.
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Volume:
38
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.38.12696
Date:
December, 1988
File:
PDF, 593 KB
english, 1988
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