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Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid
van Noort, S. John T., Willemsen, Oscar H., van der Werf, Kees O., de Grooth, Bart G., Greve, JanVolume:
15
Language:
english
Journal:
Langmuir
DOI:
10.1021/la990459a
Date:
October, 1999
File:
PDF, 396 KB
english, 1999