[IEEE 2000 International Conference on Simulation of Semiconductor Processes and Devices - Seattle, WA, USA (6-8 Sept. 2000)] 2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502) - Modeling of direct tunneling current through gate dielectric stacks
Mudanai, S., Fan, Y.-Y., Ouyang, Q., Tasch, A.F., Register, F., Kwong, D.L., Banerjee, S.Year:
2000
Language:
english
DOI:
10.1109/sispad.2000.871242
File:
PDF, 376 KB
english, 2000