Photothermal deflection densitometer for thin-layer...

Analytical Chemistry 1984 / 01 Vol. 56; Iss. 1

Photothermal deflection densitometer for thin-layer chromatography

Chen, Tsuey Ing., Morris, Michael D.
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Volume:
56
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00265a006
Date:
January, 1984
File:
PDF, 397 KB
english, 1984
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