[IEEE 2014 33rd Chinese Control Conference (CCC) - Nanjing, China (2014.7.28-2014.7.30)] Proceedings of the 33rd Chinese Control Conference - Study of fault diagnosis method based on ensemble-multi-SVM classifiers
Lv, Feng, Li, Xiang, Sun, Hao, Du, Hailian, Rong, WenjieYear:
2014
Language:
english
DOI:
10.1109/chicc.2014.6895479
File:
PDF, 242 KB
english, 2014