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Quantifying the Complexity of the Chaotic Intensity of an External-Cavity Semiconductor Laser via Sample Entropy
Li, Nianqiang, Pan, Wei, Xiang, Shuiying, Zhao, Qingchun, Zhang, Liyue, Mu, PenghuaVolume:
50
Language:
english
Journal:
IEEE Journal of Quantum Electronics
DOI:
10.1109/jqe.2014.2344691
Date:
September, 2014
File:
PDF, 900 KB
english, 2014