In Situ Characterization of Bias Instability in Bare SOI...

IEEE Transactions on Device and Materials Reliability 2014 / 9 Vol. 14; Iss. 3

In Situ Characterization of Bias Instability in Bare SOI Wafers by Pseudo-MOSFET Technique

Marquez, Carlos, Rodriguez, Noel, Fernandez, Cristina, Ohata, Akiko, Gamiz, Francisco, Allibert, Frederic, Cristoloveanu, Sorin
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2014.2332818
Date:
September, 2014
File:
PDF, 1.45 MB
english, 2014
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