A MultiScale Particle Filter Framework for Contour...

IEEE Transactions on Pattern Analysis and Machine Intelligence 2014 / 10 Vol. 36; Iss. 10

A MultiScale Particle Filter Framework for Contour Detection

Widynski, Nicolas, Mignotte, Max
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI:
10.1109/tpami.2014.2307856
Date:
October, 2014
File:
PDF, 2.02 MB
english, 2014
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