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Investigation of induced recrystallization and stress in close-spaced sublimated and radio-frequency magnetron sputtered CdTe thin films
Moutinho, H. R., Dhere, R. G., Al-Jassim, M. M., Levi, D. H., Kazmerski, L. L.Volume:
17
Year:
1999
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.581892
File:
PDF, 763 KB
english, 1999