X-ray Reflectivity Study of an Amphiphilic Hexa-...

Langmuir 2003 / 12 Vol. 19; Iss. 26

X-ray Reflectivity Study of an Amphiphilic Hexa- peri -hexabenzocoronene at a Structured Silicon Wafer Surface

Kubowicz, Stephan, Thünemann, Andreas F., Geue, Thomas M., Pietsch, Ullrich, Watson, Mark D., Tchebotareva, Natalia, Müllen, Klaus
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Volume:
19
Language:
english
Journal:
Langmuir
DOI:
10.1021/la035210e
Date:
December, 2003
File:
PDF, 95 KB
english, 2003
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