Contactless Thermal Boundary Resistance Measurement of...

IEEE Electron Device Letters 2014 / 10 Vol. 35; Iss. 10

Contactless Thermal Boundary Resistance Measurement of GaN-on-Diamond Wafers

Pomeroy, James W., Simon, Roland Baranyai, Sun, Huarui, Francis, Daniel, Faili, Firooz, Twitchen, Daniel J., Kuball, Martin
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2014.2350075
Date:
October, 2014
File:
PDF, 497 KB
english, 2014
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