Fabrication, Characterization and Loss Analysis of Silicon...

Journal of Lightwave Technology 2014 / 7 Vol. 32; Iss. 13

Fabrication, Characterization and Loss Analysis of Silicon Nanowaveguides

Qiu, Chao, Sheng, Zhen, Li, Hao, Liu, Wei, Li, Le, Pang, Albert, Wu, Aimin, Wang, Xi, Zou, Shichang, Gan, Fuwan
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Volume:
32
Language:
english
Journal:
Journal of Lightwave Technology
DOI:
10.1109/jlt.2014.2309122
Date:
July, 2014
File:
PDF, 491 KB
english, 2014
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