Design Framework to Overcome Aging Degradation of the 16 nm...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2014 / 5 Vol. 33; Iss. 5

Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits

Mounir Mahmoud, Mohamed, Soin, Norhayati, Fahmy, Hossam A. H.
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Volume:
33
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2014.2299713
Date:
May, 2014
File:
PDF, 19.75 MB
english, 2014
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