Microstructural and electrochemical characterization of Ce conversion layers formed on Al alloy 2024-T3 covered with Cu-rich smut
Luis E.M. Palomino, Idalina V. Aoki, Hercílio G. de MeloVolume:
51
Year:
2006
Language:
english
Pages:
11
DOI:
10.1016/j.electacta.2006.03.036
File:
PDF, 1.40 MB
english, 2006