Advanced fabrication process for combined atomic...

Micron 2015 / 01 Vol. 68

Advanced fabrication process for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes

Eifert, Alexander, Mizaikoff, Boris, Kranz, Christine
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Volume:
68
Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2014.08.008
Date:
January, 2015
File:
PDF, 1.85 MB
english, 2015
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