On-Chip Measurement of Rise/Fall Gate Delay Using...

IEEE Transactions on Circuits and Systems II: Express Briefs 2014 / 03 Vol. 61; Iss. 3

On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator

Das, Bishnu Prasad, Onodera, Hidetoshi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
61
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/tcsii.2013.2296118
Date:
March, 2014
File:
PDF, 913 KB
english, 2014
Conversion to is in progress
Conversion to is failed