Beam voltage manipulation for time-of-flight mass analysis...

Beam voltage manipulation for time-of-flight mass analysis of continuous ion beams

Cowen, Kenneth A., Frank, Christopher J., Coe, James V.
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Volume:
63
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00010a011
Date:
May, 1991
File:
PDF, 516 KB
english, 1991
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