High resolution TEM and triple-axis XRD investigation into...

Electrochimica Acta 2009 Vol. 54; Iss. 13

High resolution TEM and triple-axis XRD investigation into porous silicon formed on highly conducting substrates

T.L. Sudesh L. Wijesinghe, Shi Qiang Li, Mark B.H. Breese, Daniel J. Blackwood
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Volume:
54
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.electacta.2009.01.045
File:
PDF, 1.26 MB
english, 2009
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