[IEEE 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Naples, Italy (04-08 June 2006)] 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Analysis of SiC BJT RBSOA
Gao, Y., Huang, A.Q., Chen, B., Agarwal, A.K., Krishnaswami, S., Scozzie, C.Year:
2006
Language:
english
DOI:
10.1109/ISPSD.2006.1666126
File:
PDF, 2.97 MB
english, 2006