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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Verification Methodology for Self-Repairable Memory Systems
Li, Jin-fu, Wu, Chun-hsienYear:
2006
Language:
english
DOI:
10.1109/ATS.2006.261001
File:
PDF, 158 KB
english, 2006